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Surface Analysis Equipment Product List and Ranking from 11 Manufacturers, Suppliers and Companies | IPROS GMS

Last Updated： Aggregation Period:Jul 15, 2026～Aug 11, 2026
This ranking is based on the number of page views on our site.

Surface Analysis Equipment Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Jul 15, 2026～Aug 11, 2026
This ranking is based on the number of page views on our site.

  1. 一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
  2. 東邦化研 Saitama//Electronic Components and Semiconductors
  3. セイコーフューチャークリエーション Chiba//Testing, Analysis and Measurement
  4. カネカテクノリサーチ 本社、東京営業所、名古屋営業所、大阪分析センター、高砂分析センター Osaka//Testing, Analysis and Measurement
  5. 東ソー分析センター Tokyo//Testing, Analysis and Measurement
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Surface Analysis Equipment Product ranking

Last Updated： Aggregation Period:Jul 15, 2026～Aug 11, 2026
This ranking is based on the number of page views on our site.

  1. [Analysis Case] Evaluation of Coating Film on Injection Needle Surface 一般財団法人材料科学技術振興財団　MST
  2. [Analysis Case] Evaluation of the Imidization Reaction of Polyimide 一般財団法人材料科学技術振興財団　MST
  3. [Analysis Case] Evaluation of the Depth Direction State of Stainless Steel Passive Film 一般財団法人材料科学技術振興財団　MST
  4. [Analysis Case] Distribution and State Evaluation of OH on Aluminum (Al) Surface 一般財団法人材料科学技術振興財団　MST
  5. [Analysis Case] Evaluation of SUS Passive Film Depth Direction State and Oxide Film Thickness 一般財団法人材料科学技術振興財団　MST

Surface Analysis Equipment Product List

1～30 item / All 61 items

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Kitano Seiki Co., Ltd. Technical Services for Vacuum and Experimental Equipment

Kitano Seiki Co., Ltd. Technical Services for Vacuum and Experimental Equipment

Feel free to contact us about any device, regardless of the manufacturer!

To ensure that our customers can use our products with peace of mind, a reliable support system is essential. At Kitano Seiki, we have established a comprehensive support system to maintain the best condition of the equipment used by our customers. We provide services that meet the usage environment and various needs of our customers at appropriate costs. 【Various Equipment and Units】 ○ Deposition Equipment (MBE, CVD, EB, Sputtering, etc.) ○ Analysis Equipment (STM, FIM, TEM, AES, etc.) ○ Various Manipulators ○ Various Sample Transport Mechanisms For more details, please contact us or download the catalog.

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[Data] List of Analysis Machines

[Data] List of Analysis Machines

White interference-equipped laser microscopes and micro-Raman spectroscopic measurement devices, among others! A wide range of analytical instruments listed.

In this document, we present a list of various analytical instruments. Starting with the "High-Resolution Gas Chromatography Mass Spectrometry (HRGC/HRMS)," we also feature a wide range of instruments such as the "Ultra-Thin Film Scratch Tester" and the "Micro Vickers Hardness Tester." Additionally, the analysis items include "materials analysis-related" topics such as molecular weight distribution and separation analysis, as well as "environmental measurement analysis-related" topics like radiation measurement and odor analysis. Please feel free to download and take a look. 【Featured Equipment (Partial)】 ■ Ultra-High-Resolution Field Emission Scanning Electron Microscope - EDS (FE-SEM/EDS) ■ Scanning Electron Microscope - Energy Dispersive X-ray Spectroscopy (SEM-EDS) ■ Energy Dispersive X-ray Fluorescence Spectrometer (EDX) ■ Ultraviolet-Visible-Near Infrared Spectrometer (UV-VIS-NIR) ■ Fourier Transform Infrared Spectrometer (FT-IR) *For more details, please refer to the PDF document or feel free to contact us.

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  • Other environmental analysis equipment
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[Analysis Case] Evaluation of the state of the organic thin film solar cell electrode interface and the dispersion state of the organic film.

[Analysis Case] Evaluation of the state of the organic thin film solar cell electrode interface and the dispersion state of the organic film.

It is possible to conduct a comprehensive evaluation analysis that minimizes the influence of the atmosphere.

Organic devices are devices that use materials susceptible to the effects of oxygen and water. At MST, we conduct analyses with sample transport, processing methods, and measurement environments that minimize atmospheric influences, allowing for evaluations closer to true conditions. We assessed the interface state between the organic film and the electrode using XPS analysis. We can confirm the composition and bonding state of the titania present on the surface of the organic film. Through TOF-SIMS analysis, we examined the dispersion state of P3HT (p-type organic semiconductor) and PCBM (n-type organic semiconductor) within the organic film of bulk and heterostructure organic thin-film solar cells in the depth direction.

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[Analysis Case] Degradation Assessment After Charge and Discharge Cycle Testing of LIB

[Analysis Case] Degradation Assessment After Charge and Discharge Cycle Testing of LIB

From the production of battery cells to charge and discharge cycle testing, disassembly, and investigation of degradation components.

When investigating the degradation mechanisms of secondary batteries, it is important to analyze the deposits on the electrode surface. At MST, we conduct TOF-SIMS measurements under controlled atmospheric conditions, allowing us to evaluate the chemical state of the electrode's outermost surface without alteration due to exposure to the atmosphere. Additionally, by consistently performing measurements from charge-discharge cycle tests to the electrode surface, we can examine the correlation between the state of charge-discharge and the condition of the deposits on the electrode surface.

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[Analysis Case] Evaluation of the State of the Electrode/Organic Layer Interface in Organic EL Devices

[Analysis Case] Evaluation of the State of the Electrode/Organic Layer Interface in Organic EL Devices

The process will be carried out from pretreatment to XPS measurement under an inert gas atmosphere.

We physically peeled off the buffer layer/Alq3 interface and conducted XPS analysis on the peeled surface (buffer layer side). By peeling in an inert gas atmosphere, we were able to expose the interface without destroying the chemical structure, and by transporting it to the XPS device while maintaining the inert gas atmosphere, we minimized post-peeling alterations (such as oxidation and moisture absorption). The main component of the buffer layer is LiF, and it was suggested that some of it may have oxidized. By controlling the atmosphere, it is possible to evaluate the oxidation states of metal elements such as Al and Li due to differences in film formation methods, treatment methods, and organic layers.

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[Analysis Case] Depth Direction Analysis of Organic EL Material TOF-SIMS RGB Elements

[Analysis Case] Depth Direction Analysis of Organic EL Material TOF-SIMS RGB Elements

Evaluation of organic EL layer structures and degradation layers using GCIB (Ar cluster) under atmospheric control.

Organic EL displays are materials that hold the potential for high resolution and low power consumption, and market expansion is expected. In recent years, there has been a trend towards miniaturizing pixel arrangements to achieve higher image quality. When measuring small pixels, conventional oblique cutting TOF-SIMS measurements made it difficult to evaluate in the depth direction. However, by introducing GCIB (Ar cluster), it has become possible to evaluate organic EL materials in the depth direction with good reproducibility, even for small pixels, and to assess material degradation and diffusion as well. *GCIB: Gas Cluster Ion Beam

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[Analysis Case] Depth Direction Analysis of Degradation Components in GCIB_Ar Cluster Organic Materials

[Analysis Case] Depth Direction Analysis of Degradation Components in GCIB_Ar Cluster Organic Materials

Component evaluation of organic EL layer structures and degradation layers using GCIB under controlled atmosphere.

This paper presents a case study analyzing the degradation components of organic materials that deteriorate due to atmospheric exposure, using GCIB (Ar cluster). The experiment utilized the organic EL material, Rubrene. Measurements of the atmosphere-exposed samples using TOF-SIMS revealed the presence of a mass (m/z 564) estimated to be Rubrene peroxide, as well as low molecular weight benzene-related masses (m/z 77, 105). It was confirmed that these degradation-related components exist at depths of approximately 1μm or more from the surface. *GCIB: Gas Cluster Ion Beam

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[Analysis Case] Layered Structure Analysis of Heat-Resistant PET Bottles for Food Use

[Analysis Case] Layered Structure Analysis of Heat-Resistant PET Bottles for Food Use

It is possible to identify the components of each layer of PET bottles using TOF-SIMS.

PET bottles allow a small amount of air (oxygen) to permeate, making the beverages inside susceptible to the effects of oxygen intrusion from the outside, which leads to a deterioration in quality. To address this, various innovations have been made in PET bottles. For example, by inserting an oxygen-absorbing layer between the PET layers, as shown in Figure 1, the deterioration of beverages is prevented, preserving their taste. This document presents the results of analyses conducted using TOF-SIMS to confirm what the oxygen-absorbing layer is composed of.

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[Analysis Case] Evaluation of SUS Passive Film Depth Direction State and Oxide Film Thickness

[Analysis Case] Evaluation of SUS Passive Film Depth Direction State and Oxide Film Thickness

It is possible to capture molecular information of inorganic substances in the depth direction using TOF-SIMS.

Stainless steel (SUS) is excellent in corrosion resistance and is used in various industrial products and components. Although it is a material resistant to corrosion, changes in the composition of the surface passive film due to aging or processing can lead to issues. In this instance, we introduce a case study analyzing the state of the metal oxide film on the surface of stainless steel using TOF-SIMS. TOF-SIMS allows for the high-sensitivity acquisition of molecular information in the oxide state, enabling the distribution of oxides ranging from a few nanometers to several tens of nanometers on the surface to be obtained, and spatial distribution can be evaluated through image analysis. Measurement method: TOF-SIMS Product field: Manufacturing equipment and components Analysis purpose: Evaluation of chemical bonding state, composition distribution, and thickness of corrosion layers For more details, please download the materials or contact us.

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[Analysis Case] Analysis of the Multilayer Structure of Polymer Films

[Analysis Case] Analysis of the Multilayer Structure of Polymer Films

Clear visualization of the layer structure of multilayer films using low-damage sputtering with GCIB.

The functionality of films is known to be determined by factors such as material, thickness, and layer structure. In this study, we evaluated the layer structure of polyethylene-based multilayer films commonly used as food wrap. By confirming that the film is primarily composed of polyethylene using FT-IR, and employing GCIB (Ar cluster) for sputtering, we were able to clearly visualize the structure where polyethylene and nylon 6 are layered within a thickness of 10μm through depth profiling with TOF-SIMS.

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[Analysis Case] Evaluation of the Chemical State of IGZO Film

[Analysis Case] Evaluation of the Chemical State of IGZO Film

Evaluation of bonding state and electronic state using XPS and UPS.

IGZO films are materials that are being researched and developed as TFT materials for displays. Since they are composed of multiple metal elements, it is important to understand how the composition, bonding state, and electronic state change depending on the process. We will introduce examples of evaluating the composition, bonding state, and electronic state of IGZO film surfaces using XPS and UPS.

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[Analysis Case] Evaluation of Damage Layer on Polymer Surface Due to Ion Irradiation

[Analysis Case] Evaluation of Damage Layer on Polymer Surface Due to Ion Irradiation

By using GCIB (Ar cluster), it is possible to evaluate the composition and thickness of the damaged layer.

By irradiating the surface of polymer materials with ions, changes in surface properties occur. Utilizing these changes, research is being conducted in a wide range of fields, including the development of functional materials. Evaluating the changes that occur in the surface state after ion irradiation is important for efficient research and development. In TOF-SIMS analysis, using a GCIB (Gas Cluster Ion Beam) for the sputtering ion beam makes it possible to evaluate the composition and thickness of the damage layer caused by ion irradiation on the surface of polymer materials.

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[Analysis Case] Evaluation of the sp2/(sp2+sp3) Ratio of DLC Films

[Analysis Case] Evaluation of the sp2/(sp2+sp3) Ratio of DLC Films

Evaluation of the sp2/(sp2+sp3) ratio using C1s waveform analysis.

Due to its characteristics such as high hardness and high wear resistance, DLC (diamond-like carbon) films are utilized in a wide range of fields. These films are materials that lie between graphite and diamond, and the separation of sp2 (graphite structure) and sp3 (diamond structure) within the film to obtain the sp2/(sp2+sp3) ratio is one of the important factors that determine the properties of the film. Here, we will introduce an example of evaluating this sp2/(sp2+sp3) ratio by analyzing the C1s spectrum using XPS.

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[Analysis Case] Removal of Organic Contaminants by Etching

[Analysis Case] Removal of Organic Contaminants by Etching

We will remove surface contamination and conduct an evaluation using XPS.

XPS is a surface-sensitive technique, so carbon derived from organic contaminants due to the atmosphere is detected at a significant level. Reducing the influence of this carbon from organic contaminants is important for evaluating the original composition of the film. Typically, Ar ion sputtering is used to remove organic contaminants, but damage caused by sputtering may prevent the evaluation of the film's original composition and bonding states. We present an example where the influence of carbon from organic contaminants was reduced by removing the surface oxide layer using wet etching instead of Ar ion sputtering.

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Comparison of depth profiling analysis using XPS and AES.

Comparison of depth profiling analysis using XPS and AES.

XPS: X-ray Photoelectron Spectroscopy AES: Auger Electron Spectroscopy

XPS and AES are surface-sensitive analytical techniques widely used for evaluating sample surfaces, but by combining them with ion etching, depth profiling analysis becomes possible. When conducting depth profiling analysis, it is important to appropriately differentiate between XPS and AES according to the area to be measured and the material of the sample in order to perform analysis that aligns with the objectives. The characteristics of depth profiling analysis using XPS and AES will be compared using the analysis of SUS passive films as an example.

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[Analysis Case] Surface Contamination Assessment of Si Wafers Stored Using TOF-SIMS

[Analysis Case] Surface Contamination Assessment of Si Wafers Stored Using TOF-SIMS

Evaluation of contamination and oxidation of Si wafers after removing the oxide film with hydrofluoric acid treatment.

Knowledge about the effects of contamination and oxidation during sample transport is important in surface analysis where the detection depth is on the nanometer order. Therefore, we examined the impact of contamination and oxidation due to differences in storage methods on Si wafers. In storage with wrapping paper and aluminum foil, there is a tendency for the peaks of organic materials caused by secondary contamination to be weaker. When samples are wrapped and stored in the matte side of aluminum foil during storage and transport, it can suppress contamination and oxidation compared to other storage methods.

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[Analysis Case] Component Analysis of Organic EL Emission Layer

[Analysis Case] Component Analysis of Organic EL Emission Layer

Possible to dismantle and preprocess while maintaining the atmosphere, up to the introduction of equipment.

It is known that organic EL materials undergo changes when exposed to air. We present results obtained from TOF-SIMS regarding the surface state of luminescent materials left in a nitrogen atmosphere and in the atmosphere. In samples produced in a nitrogen atmosphere, parent ions are primarily detected, but when left in air, fragments with oxygen attached to the parent ions are detected. For materials that are prone to degradation, it is necessary to analyze them without exposing them to the atmosphere.

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[Analysis Case] Evaluation of the Condition of Foreign Matter with Surface Oxidation Film

[Analysis Case] Evaluation of the Condition of Foreign Matter with Surface Oxidation Film

Evaluation of aluminum hydroxide Al(OH)3 and aluminum oxide Al2O3 is possible.

If you want to qualitatively evaluate metallic foreign substances, analyzing only the very surface may result in information about the oxide film present on the surface of the foreign substance, and you may not obtain information about the foreign substance itself. By performing depth analysis using TOF-SIMS, it is possible to evaluate the composition and state of the foreign substance located deeper than the oxide film. This document presents case studies evaluating the state of three locations that are believed to contain aluminum-based foreign substances.

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[Analysis Case] Evaluation of Coating Film on Injection Needle Surface

[Analysis Case] Evaluation of Coating Film on Injection Needle Surface

Visualization of the distribution and coating condition of water-repellent films, coatings, and membranes.

Medical injection needles reduce puncture resistance and lessen the physical burden on patients by coating the surface of the metal tube with silicone. To maintain the performance of the needle, it is important that the entire surface is covered with a coating film. This report introduces a case where imaging analysis of the opening at the tip of the injection needle was conducted using TOF-SIMS to evaluate whether the coating film was applied. Since TOF-SIMS detects information from the very surface, it can assess the condition of the coating film without detecting the underlying elements.

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[Analysis Case] Evaluation of Gas Barrier Membrane of Plastic Containers Using XPS

[Analysis Case] Evaluation of Gas Barrier Membrane of Plastic Containers Using XPS

Qualitative analysis of organic films and separation and quantification of the bonding states of each element.

Plastic containers, such as PET bottles used in many food products, have features like being lightweight and unbreakable; however, a challenge has been their lower gas barrier properties compared to cans and bottles. In recent years, technologies have been developed to coat PET bottles with gas barrier films to prevent quality degradation due to oxygen intrusion and carbonation loss, and these technologies are now widely used. This document presents a case study on the measurement of commercially available PET bottles, along with an evaluation of the composition and chemical bonding state of the gas barrier films.

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[Analysis Case] Depth Direction Analysis of XPS on the Micron (μm) Order

[Analysis Case] Depth Direction Analysis of XPS on the Micron (μm) Order

Depth direction analysis will be conducted to a depth of several micrometers.

XPS is a surface-sensitive technique widely used for evaluating sample surfaces, but when combined with ion etching, it allows for depth analysis. In addition to the compositional distribution in the depth direction, XPS also enables the assessment of bonding states, making it suitable for investigating the causes of discoloration on the surfaces of device components. This document presents a case study evaluated by XPS regarding the discoloration of the blades of a turbo molecular pump.

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[Analysis Case] Analysis of Organic EL (OLED) Emission Layer

[Analysis Case] Analysis of Organic EL (OLED) Emission Layer

Quantitative evaluation of the guest in the light-emitting layer and film thickness is possible.

Organic EL displays are advancing towards practical use by leveraging advantages such as high brightness, high-resolution color, and thinness due to their self-emission principle. In the emission layer, guest molecules are doped into host molecules to enhance the emission efficiency. In this study, we identified the emission layer materials for red pixels in organic EL display elements. Additionally, we conducted thickness evaluation of the emission layer using a newly developed step gauge and quantified the guest materials within the emission layer. This allows for qualitative and quantitative analysis of guest molecules in the emission layer, as well as evaluation of the thickness of the emission layer. Measurement methods: TOF-SIMS, TEM, XPS Product field: Displays Analysis purpose: Composition evaluation, identification, thickness evaluation For more details, please download the materials or contact us.

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[Analysis Case] Evaluation of the Imidization Reaction of Polyimide

[Analysis Case] Evaluation of the Imidization Reaction of Polyimide

The degree of imidization due to differences in heating conditions can be evaluated using XPS.

Polyimide has very high heat resistance and excellent electrical insulation and mechanical properties, making it an essential material not only for electronic components but also for a wide range of fields such as precision machinery, automobiles, and aerospace. In its reliability evaluation, research on imide bonds is important. This document presents an example of XPS measurements conducted on polyimide before and after heating. Changes in the amount of oxygen and the chemical shifts of carbon, nitrogen, and oxygen confirmed that imidization progressed after heating. Additionally, by performing waveform analysis, it is also possible to determine the proportion of polyimide present.

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[Analysis Case] Composition Analysis of the Surface Film on the Positive Electrode of Secondary Batteries

[Analysis Case] Composition Analysis of the Surface Film on the Positive Electrode of Secondary Batteries

Evaluation of the distribution of organic components and active substances on the surface, qualitative analysis.

The segregation of components and the formation of films on the surface of the positive electrode of lithium-ion secondary batteries are factors that influence the electric capacity. We will introduce a case study on Li(NiCoMn)O2 (NCM), which is used as a positive electrode, where micro-region mapping was conducted using AES, and qualitative analysis of organic components (binder) and active material surface films was performed using XPS and TOF-SIMS. These methods allow for analysis with a series of treatments conducted under an Ar atmosphere, which helps to suppress the alteration of the sample.

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[Analysis Case] Simultaneous Qualitative Analysis of Inorganic and Organic Contaminants/Adhesives on Wafers

[Analysis Case] Simultaneous Qualitative Analysis of Inorganic and Organic Contaminants/Adhesives on Wafers

Simultaneous measurement of inorganic and organic components in minute specific areas.

TOF-SIMS has features such as simultaneous evaluation of organic and inorganic materials, capability for micro-area analysis, and high sensitivity for analyzing the very surface, making it effective for residue investigation in cleaning processes. An example is presented where pure water was dried on a silicon wafer. Optical microscopy only reveals slight point-like foreign substances and cloudiness. However, the results measured by TOF-SIMS showed that in the contaminated areas, organic components such as hydrocarbons, PDMS, and amides, which tend to adsorb naturally, were aggregated.

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Data DL available: Case studies on surface analysis 2 (XPS/AES/AFM)

Data DL available: Case studies on surface analysis 2 (XPS/AES/AFM)

We have carefully selected case studies using XPS, AES, and AFM for discoloration investigation and surface modification evaluation. Please take a look and download the materials.

In this case study collection, we will introduce examples related to "surface analysis." We feature numerous characteristics and analysis cases, including "investigation of discoloration on material surfaces using XPS," "evaluation of surface modification of PET using XPS," "analysis of hydrophobic films using XPS," and "evaluation of heating effects on plated parts." Additionally, we present analysis results, discoloration investigations, surface modification evaluations, and analyses of hydrophobic films. We encourage you to read through it. [Contents] ■ Investigation of discoloration on material surfaces using XPS ■ Evaluation of surface modification of PET using XPS ■ Analysis of hydrophobic films using XPS ■ Evaluation of heating effects on plated parts (AFM, AES) *For more details, please refer to the PDF document or feel free to contact us.

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Evaluation of the heating effects on plated parts using AFM/AES Auger electron spectroscopy.

Evaluation of the heating effects on plated parts using AFM/AES Auger electron spectroscopy.

We will conduct a multifaceted investigation of heating effects on plated components using AFM scanning probe microscopy and AES Auger electron spectroscopy.

The AFM scanning probe microscope is a device that detects various physical interactions occurring between the probe and the sample surface, allowing for the observation of surface shapes in minute areas and the measurement of electrical and mechanical properties. These physical interactions include atomic forces, frictional forces, and electrostatic forces. Additionally, measurements can be conducted in various environments, including atmospheric and vacuum conditions, enabling the observation of sample surfaces regardless of whether they are conductive or insulating. The AES Auger electron spectrometer allows for elemental analysis of the extreme surface layer of materials (approximately 5nm) and investigation of concentration gradients in the depth direction. Using these two analytical devices, we conducted a study on the heating effects on the surface of plated connector contact pins. Please take a moment to read the PDF materials. Furthermore, in addition to these analytical devices, our company also conducts various surface analyses such as XPS and GD-OES. We would be happy to assist you, so please feel free to reach out to us. Seiko Future Creation Official Website https://www.seiko-sfc.co.jp/ *Other materials are also available. If you request through the inquiry button, we will send them to you.

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Book Surface and Depth Analysis Methods [New Edition]

Book Surface and Depth Analysis Methods [New Edition]

A clear explanation of surface analysis for developers and manufacturers who are not specialists in analysis!

○Publication Date: December 10, 2007 ○Format: B5 size, paperback, 618 pages ○Price: 33,000 yen (excluding tax) → STbook member price: 31,350 yen (excluding tax) First Edition: December 2007 This book is a revised edition of "Surface and Depth Analysis Methods," published in December 2007 (ISBN 978-4-903413-30-3), with updated binding and pricing. The content is the same as the 2007 publication, so please be careful not to make a mistake when purchasing. ○Authors: Hiroyoshi Soejima, Shimadzu Scientific Research Institute, Inc. / Takeshi Teratani, Sumika Chemical Analysis Service, Ltd. / Junichiro Murayama, Sumitomo Metal Technology, Ltd. / Shinji Nagamachi, Ion Engineering Research Institute, Inc. / Keizo Ishii, Tohoku University / Kazutoshi Kakita, Nippon Steel Technoresearch, Inc. / Makoto Nishino, Shimadzu Corporation / Makishi Ishikawa, Cameca Instruments, Inc. / Takahiro Hoshi, ULVAC, Inc. / Satoshi Kawata, SII Nanotechnology, Inc. / Satoshi Yoshimi, Shimadzu Comprehensive Analysis Testing Center / and 45 others.

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Technical Information Magazine 201902-02 Development of Atmospheric Pressure RBS Analysis

Technical Information Magazine 201902-02 Development of Atmospheric Pressure RBS Analysis

The technical information magazine The TRC News provides the latest information on analytical techniques that are useful for research and development, solving production troubles, and quality control.

**Abstract** In many cases, the analysis targets in surface analysis are limited to those that can be maintained in a vacuum. On the other hand, by applying the potential of high-speed ions, it is possible to bring the analysis probe out to atmospheric pressure. At TRC, we examined Rutherford backscattering spectroscopy (RBS) at atmospheric pressure and succeeded in its realization. This paper reports on depth analysis of solid/liquid interfaces using atmospheric pressure RBS, evaluation of depth distribution of quantum dots in HeLa cells, and depth analysis of hydrogen in wet samples using atmospheric pressure RBS/HFS (hydrogen forward scattering analysis). **Table of Contents** 1. Introduction 2. Solid/Liquid Interface Analysis 3. Application to Biological Samples 4. Development of Measurement System at TRC: Atmospheric Pressure RBS/HFS Analysis 5. Conclusion

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Announcement of Exhibition Participation and Exhibitor Presentations "eX-Tech2026"

Announcement of Exhibition Participation and Exhibitor Presentations "eX-Tech2026"

We will be exhibiting at the eX-Tech 2026 microelectronics show within the JPCA Show 2026.

From June 10 (Wednesday) to June 12 (Friday), 2026, we will be exhibiting at the Microelectronics Show eX-Tech 2026, part of the Total Solutions Exhibition for Electronic Devices "JPCA Show 2026," held at Tokyo Big Sight, East Exhibition Hall.

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